Solutions
Optical Lab
Overview
Wafer-level optical test and thin-film characterization built for silicon-photonics (SiPh) product development.
Driven by Telecom/Datacom, HPC and AI, SiPh offers greater bandwidth, low-latency transmission over longer distances, low power and high package integration. ASE developed comprehensive optical testing to support these products.
Wafer-level test
Optical and electrical test (O/O and O/E) for 200 mm and 300 mm photonics wafers.
- Optical insertion loss (IL) / polarization-dependent loss (PDL) spectrum sweep; photodetector (PD) responsivity measurement
- Grating-coupler test at various incident angles (e.g. 8 / 10 / 12°) with single-mode fiber (SMF) or multi-channel fiber-array unit (FAU) as optical probe
- C-, L- or O-band tunable laser (1240–1380 nm / 1490–1640 nm) with polarization synthesizer and multi-channel optical power meter
O/O testing with SMFO/E testing with SMF and DC probeO/E testing with FAU and DC probe cards
Thin-film
Optical thin-film Characterization, Modeling and Simulation
- Transmittance / reflectivity
- Wavelength spectrum
- Dimension measurement
- Optical structure optimization
See Other labs
